Xrf analysis company in Chelmsford, MA

Microscopy services by Microvisionlabs.com? SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects.

The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.

The profile of the flow of the solder at these bonds was documented using the SEM with backscatter imaging, which correlates brightness in the image with atomic density. Some voids were found in the solder as shown the SEM image. An EDS spectrum of the solder was acquired which showed that the solder was a tin/lead (80/20) solder. The EDS map clearly shows the copper wire and copper pad (red) with the tin lead solder (light blue) that appears to have flowed well and made a good bond between the copper elements. This map also shows the fiberglass bundles that add structural integrity to the board.

Do you give lab tours? Yes, we routinely give lab tours to our clients and potential clients. Please call and we would be happy to schedule a tour for you and your co-workers. Do you have other locations around the country? We do work for companies all across the United States, with one laboratory which is located in Chelmsford, Massachusetts. Did MicroVision Labs ever operate under a different company name? No, we have always been MicroVision Laboratories, Inc. Our founder, John Knowles, used to work for another laboratory that underwent several name changes (Eastern Analytical Laboratories, Industrial Environmental Analysts, American Environmental Network, Severn Trent Laboratories, and EMLab P&K Billeria) and was located nearby in Billerica. When that laboratory was closed in 2008, John hired a few of the remaining analysts and acquired its equipment, client list and phone number. Read even more info at microscopy services.

The client was contacted with the results, and was curious as to what the source of these particles might be. After consulting with the office manager, it was determined that some pieces of furniture present had relatively significant amounts of direct water exposure, and were subsequently dried a number of times during remittance construction. Inspection of these pieces of furniture showed that they had high density, close packed foam cushions of a type similar to the particles observed in the surrounding area, which had been broken down by the repeated wet/dry cycle.

We are proud to announce that MicroVision Labs is now accredited to the ISO/IEC 17025:2017 standard. This represents over a year of diligent effort from all of our staff to verify and validate our in house SOP’s and transform our quality management system to one that is compliant to this international standard. This certification requires that accredited labs demonstrate that they are competent and can produce technically valid data and results unlike other certifications such as ISO 9001:2015. This represents an obvious value to our clients. See a few extra info on https://microvisionlabs.com/.