Microscopy and elemental mapping services in Chelmsford

Microscopy lab and elemental mapping company with MicroVision Laboratories, Inc.? The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.

SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects.

How do I submit a sample or a set of samples? To submit a sample or set of samples, please see the page How to Submit Samples. What if I believe my samples are hazardous? We are not equipped to handle or dispose of every kind of hazardous material. Please call us before sending in any potentially hazardous samples. In cases where we are able to analyze your harzardous samples we may not be able to dispose of them and therefore we will return them to you. Discover additional info on this site.

A device manufacturer had a product that involved a few different boards with varying components. There were circumstances that caused the need for a change in manufacturers of one of the boards. Due to this change, the device production at this facility would be shut down until the boards from this new vendor were validated. The Quality Control department required that an inspection of the solder joints of some of the components on the board be analyzed in order to determine whether this new board manufacturer met their specifications. If the desired specifications were met and no issues were found during the inspection of the joints then production of the devices could resume.

?We partner with companies in all phases of product development and sales, including R&D, manufacturing, QC, advertising and failure analysis. Our laboratory offers a highly-trained and experienced staff utilizing a powerful set of analytical tools (SEM with EDS and backscatter detectors, Bruker X-Flash elemental mapping, X-Ray imaging, Micro-FTIR spectroscopy, Micro-XRF, light microscopy, cross sectioning/precision polishing and microhardness testing).

A client responsible for maintaining the facilities in a public school district called with concerns of a possible mold problem. Areas with high foot traffic, especially those where students tracked water in, were showing dark black spots in the floor tiles. Aggressive cleaning and buffing of the floor would remove the problem for a while, but after several few weeks, the problem resurfaced. The facilities management staff was convinced it was mold related, but sending samples, swabs, and air grabs to a mold lab for culturing showed no sign of fungal structures on the tiles. Find additional details on this website.